Clearing up the fundamentals of static electricity, these readings give an account of the semiconductor's breakdown caused by static, the problem caused by dust and foreign particles, and their countermeasures. They point out controversial points in the current methods, adduce new ideas and process, and introduce their application examples.
※These are to be issued in series.
TRINC LIBRARY > Static electricity readings (No.1: Static and dust fundamentals - 1)
  • <No.38> Static and dust fundamentals -38

Serialization No.38

Static and Dust Fundamentals - 38
(Table of contents)


Until the last number, we had covered 2 Problems caused by the static, 3 Fundamentals of the static, 4 Fundamentals of dust, 5 Fundamentals of antistatic and anti-dust measures, and 6 Antistatic and anti-dust measures of new age. In this number we discuss a sequel to 7 Anti-static/dust measures with full of errors.

7.Antistatic and anti-dust measures with full of errors

 7-11. Antistatic/dust measures for clean bench

  7-11-1. It has been originally a bigger device.
   [1] Conventional clean bench
   [2] New type clean bench
  7-11-2. The filter on the conventional system has had a short life.
   [1] Conventional clean bench
   [2] New clean bench
  7-11-3. The conventional system allows the pollution (a worker) to get inside.
   [1] Conventional clean bench
   [2] New clean bench
  7-11-4. The cleanliness that has taken a long to get in the past
   [1] Conventional clean bench
   [2] New clean bench
  7-11-5. There is a dust intrusion into the conventional clean bench.
   [1] Conventional clean bench
   [2] New clean bench
  7-11-6. There has been a limitation in cleanliness on the conventional clean
   bench.
   [1] Conventional clean bench
   [2] New clean bench
  7-11-7. Difficulty in conventional clean bench maintenance
   [1] Frequency of maintenance
   [2] Easiness of maintenance








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